Recent Developments on Impedance Measurements with DSP based Ellipse Fitting Algorithms

Abstract

In this paper, recent advances of a new digital-signalprocessor (DSP)-based impedance measurement instrument under development are presented. The digital signal processing algorithms are based on ellipse fitting for the extraction of the acquired sine signal parameters so that the impedance magnitude and phase can be determined. Special attention is devoted to the improvement of the algorithm’s efficiency, i.e., by enabling the acquisition of a large number of samples by processing nonconsecutive data segments with no extra memory requirements. This capability is shown to reduce the experimental uncertainties of the estimated parameters. The systematic errors caused by the two different acquisition channels are measured and taken into account. The combined experimental measurement uncertainty is evaluated for the frequency sweep measurement of a particular impedance.