Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist samplig
| dc.contributor.author | Tlemçani, Mouhaydine | |
| dc.contributor.author | André, Albino | |
| dc.contributor.author | Hugo, G. Silva | |
| dc.contributor.author | Mourad, Bezzeghoud | |
| dc.contributor.editor | Prof. Dr. SANZ-BOBI, MIGUEL A. | |
| dc.contributor.editor | Prof. Dr. COLAK, ILHAMI | |
| dc.contributor.editor | Prof. Dr. KUROKAWA, FUJIO | |
| dc.date.accessioned | 2014-02-06T18:13:39Z | |
| dc.date.available | 2014-02-06T18:13:39Z | |
| dc.date.issued | 2013-10-23 | |
| dc.description.abstract | Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum. | por |
| dc.identifier.authoremail | tlem@uevora.pt | |
| dc.identifier.authoremail | aalbino@uevora.pt | |
| dc.identifier.authoremail | hgsilva@uevora.pt | |
| dc.identifier.authoremail | mourad@uevora.pt | |
| dc.identifier.citation | M. Tlemcani, A. Albino, H.G:Silva, M. Bezzeghoud. Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist sampling. ICREA 2013 | por |
| dc.identifier.scientificarea | 501 | por |
| dc.identifier.uri | http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=31662 | |
| dc.identifier.uri | http://hdl.handle.net/10174/10600 | |
| dc.language.iso | por | por |
| dc.peerreviewed | yes | por |
| dc.publisher | ICRERA 2013 | por |
| dc.rights | restrictedAccess | por |
| dc.subject | capacitors | por |
| dc.subject | ADC | por |
| dc.subject | ellipse fitting | por |
| dc.title | Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist samplig | por |
| dc.type | article | por |